Manop Phankokkruad, Sirirat Wacharawichanant. Convolutional Neural Network Models for Scattering Pattern Recognition of Scanning Electron Microscopy Images. In 5th International Conference on Computational Science / Intelligence and Applied Informatics, CSII 2018, Yonago, Japan, July 10-12, 2018. pages 27-31, IEEE, 2018. [doi]
Abstract is missing.