Measuring properties of molecular surfaces using ray casting

Mike Phillips, Iliyan Georgiev, Anna Katharina Dehof, Stefan Nickels, Lukas Marsalek, Hans-Peter Lenhof, Andreas Hildebrandt, Phillip Slusallek. Measuring properties of molecular surfaces using ray casting. In 24th IEEE International Symposium on Parallel and Distributed Processing, IPDPS 2010, Atlanta, Georgia, USA, 19-23 April 2010 - Workshop Proceedings. pages 1-7, IEEE, 2010. [doi]

Authors

Mike Phillips

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Iliyan Georgiev

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Anna Katharina Dehof

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Stefan Nickels

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Lukas Marsalek

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Hans-Peter Lenhof

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Andreas Hildebrandt

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Phillip Slusallek

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