Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs

Michele Piazza, Christian Dua, Mourad Oualli, Erwan Morvan, Dominique Carisetti, Frédéric Wyczisk. Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs. Microelectronics Reliability, 49(9-11):1222-1225, 2009. [doi]

Abstract

Abstract is missing.