Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures - researchr publication

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Michal Piekarski, Joanna Jaworek-Korjakowska, Adriana Wawrzyniak. Automatic Analysis and Anomaly Detection System of Transverse Electron Beam Profile Based on Advanced and Interpretable Deep Learning Architectures. J. Artif. Intell. Soft Comput. Res., 14(2):139-156, 2024. [doi]

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