Re-usable 180nm CMOS dosimeter based on a floating gate device

Evgeny Pikhay, Yakov Roizin, Umberto Gatti, Cristiano Calligaro. Re-usable 180nm CMOS dosimeter based on a floating gate device. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 125-128, IEEE, 2016. [doi]

Authors

Evgeny Pikhay

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Yakov Roizin

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Umberto Gatti

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Cristiano Calligaro

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