Evgeny Pikhay, Yakov Roizin, Umberto Gatti, Cristiano Calligaro. Re-usable 180nm CMOS dosimeter based on a floating gate device. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 125-128, IEEE, 2016. [doi]
@inproceedings{PikhayRGC16,
title = {Re-usable 180nm CMOS dosimeter based on a floating gate device},
author = {Evgeny Pikhay and Yakov Roizin and Umberto Gatti and Cristiano Calligaro},
year = {2016},
doi = {10.1109/ICECS.2016.7841148},
url = {http://dx.doi.org/10.1109/ICECS.2016.7841148},
researchr = {https://researchr.org/publication/PikhayRGC16},
cites = {0},
citedby = {0},
pages = {125-128},
booktitle = {2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016},
publisher = {IEEE},
isbn = {978-1-5090-6113-6},
}