Creep measurement and choice of creep laws for BGA assemblies' reliability simulation

S. Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont. Creep measurement and choice of creep laws for BGA assemblies' reliability simulation. Microelectronics Reliability, 88:1172-1176, 2018. [doi]

Authors

S. Pin

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Alexandrine Guédon-Gracia

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Jean-Yves Delétage

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Hélène Frémont

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