Creep measurement and choice of creep laws for BGA assemblies' reliability simulation

S. Pin, Alexandrine Guédon-Gracia, Jean-Yves Delétage, Hélène Frémont. Creep measurement and choice of creep laws for BGA assemblies' reliability simulation. Microelectronics Reliability, 88:1172-1176, 2018. [doi]

Abstract

Abstract is missing.