An improved second-order sliding-mode control scheme robust against the measurement noise

Alessandro Pisano, Elio Usai. An improved second-order sliding-mode control scheme robust against the measurement noise. In 42nd IEEE Conference on Decision and Control, CDC 2003, Maui, Hawaii, USA, December 9-12, 2003. pages 3519-3524, IEEE, 2003. [doi]

@inproceedings{PisanoU03,
  title = {An improved second-order sliding-mode control scheme robust against the measurement noise},
  author = {Alessandro Pisano and Elio Usai},
  year = {2003},
  doi = {10.1109/CDC.2003.1271693},
  url = {https://doi.org/10.1109/CDC.2003.1271693},
  researchr = {https://researchr.org/publication/PisanoU03},
  cites = {0},
  citedby = {0},
  pages = {3519-3524},
  booktitle = {42nd IEEE Conference on Decision and Control, CDC 2003, Maui, Hawaii, USA, December 9-12, 2003},
  publisher = {IEEE},
  isbn = {0-7803-7924-1},
}