Kunal J. Pithadiya, Chintan K. Modi, Jayesh D. Chauhan. Machine vision based liquid level inspection system using ISEF edge detection technique. In B. K. Mishra, editor, Proceedings of the ICWET 10 International Conference & Workshop on Emerging Trends in Technology, Mumbai, Maharashtra, India, February 26 - 27, 2010. pages 601-605, ACM, 2010. [doi]
@inproceedings{PithadiyaMC10,
title = {Machine vision based liquid level inspection system using ISEF edge detection technique},
author = {Kunal J. Pithadiya and Chintan K. Modi and Jayesh D. Chauhan},
year = {2010},
doi = {10.1145/1741906.1742044},
url = {http://doi.acm.org/10.1145/1741906.1742044},
tags = {rule-based},
researchr = {https://researchr.org/publication/PithadiyaMC10},
cites = {0},
citedby = {0},
pages = {601-605},
booktitle = {Proceedings of the ICWET 10 International Conference & Workshop on Emerging Trends in Technology, Mumbai, Maharashtra, India, February 26 - 27, 2010},
editor = {B. K. Mishra},
publisher = {ACM},
isbn = {978-1-60558-812-4},
}