Machine vision based liquid level inspection system using ISEF edge detection technique

Kunal J. Pithadiya, Chintan K. Modi, Jayesh D. Chauhan. Machine vision based liquid level inspection system using ISEF edge detection technique. In B. K. Mishra, editor, Proceedings of the ICWET 10 International Conference & Workshop on Emerging Trends in Technology, Mumbai, Maharashtra, India, February 26 - 27, 2010. pages 601-605, ACM, 2010. [doi]

Abstract

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