Noise Modeling For Charge Amplification and Sampling - researchr publication authors

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Patrick Pittet, Guo-Neng Lu, Laurent Quiquerez. Noise Modeling For Charge Amplification and Sampling. In 13th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2006, Nice, France, December 10-13, 2006. pages 9-12, IEEE, 2006. [doi]

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