J. S. Pittman, W. C. Bruce. Test Logic Economic Considerations in a Commercial VLSI Chip Environment. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 31-39, IEEE Computer Society, 1984.
@inproceedings{PittmanB84,
title = {Test Logic Economic Considerations in a Commercial VLSI Chip Environment},
author = {J. S. Pittman and W. C. Bruce},
year = {1984},
tags = {meta-model, testing, C++, logic, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/PittmanB84},
cites = {0},
citedby = {0},
pages = {31-39},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
publisher = {IEEE Computer Society},
}