Sensitivity of parallel applications to large differences in bandwidth and latency in two-layer interconnects - researchr publication

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Aske Plaat, Henri E. Bal, Rutger F. H. Hofman, Thilo Kielmann. Sensitivity of parallel applications to large differences in bandwidth and latency in two-layer interconnects. Future Generation Comp. Syst., 17(6):769-782, 2001. [doi]

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