Jim Plusquellic, Donald E. Owen, Tom J. Mannos, Brian Dziki. Information Leakage Analysis Using a Co-Design-Based Fault Injection Technique on a RISC-V Microprocessor. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(3):438-451, 2022. [doi]
@article{PlusquellicOMD22,
title = {Information Leakage Analysis Using a Co-Design-Based Fault Injection Technique on a RISC-V Microprocessor},
author = {Jim Plusquellic and Donald E. Owen and Tom J. Mannos and Brian Dziki},
year = {2022},
doi = {10.1109/TCAD.2021.3065915},
url = {https://doi.org/10.1109/TCAD.2021.3065915},
researchr = {https://researchr.org/publication/PlusquellicOMD22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {41},
number = {3},
pages = {438-451},
}