Ardian Kristanto Poernomo, Vivekanand Gopalkrishnan. Mining Statistical Information of Frequent Fault-Tolerant Patterns in Transactional Databases. In Proceedings of the 7th IEEE International Conference on Data Mining (ICDM 2007), October 28-31, 2007, Omaha, Nebraska, USA. pages 272-281, IEEE Computer Society, 2007. [doi]
Abstract is missing.