Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique

Dionyz Pogany, J. Kuzmik, J. Darmo, Martin Litzenberger, Scrgey Bychikhin, K. Unterrainer, Z. Mozolova, S. Hascik, Tibor Lalinsky, E. Gornik. Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique. Microelectronics Reliability, 42(9-11):1673-1677, 2002. [doi]

Abstract

Abstract is missing.