Mathias Poik, Thomas Hackl, Stefano Di Martino, Martin Schober, Jin Dang, Georg Schitter. Analysis of Cross-Talk Induced Measurement Errors in Model-Based RF Voltage Sensing. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2023, Kuala Lumpur, Malaysia, May 22-25, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.