Ilia Polian, Hideo Fujiwara. Functional constraints vs. test compression in scan-based delay testing. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 1039-1044, European Design and Automation Association, Leuven, Belgium, 2006. [doi]
Abstract is missing.