Sequential n -Detection Criteria: Keep It Simple - researchr publication authors

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Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker. Sequential n -Detection Criteria: Keep It Simple. In 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 8-10 July 2002, Isle of Bendor, France. pages 189, IEEE Computer Society, 2002. [doi]

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