Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation - researchr publication authors

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B. S. Poling, G. D. Via, K. D. Bole, E. E. Johnson, J. M. McDermott. Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation. Microelectronics Reliability, 68:13-20, 2017. [doi]

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