Photon emission microscopy of inter/intra chip device performance variations

Stas Polonsky, M. Bhushan, A. Gattiker, Alan J. Weger, Peilin Song. Photon emission microscopy of inter/intra chip device performance variations. Microelectronics Reliability, 45(9-11):1471-1475, 2005. [doi]

Abstract

Abstract is missing.