Thomas Polzer, Andreas Steininger. A general approach for comparing metastable behavior of digital CMOS gates. In 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, Slovakia, April 20-22, 2016. pages 56-61, IEEE, 2016. [doi]
@inproceedings{PolzerS16,
title = {A general approach for comparing metastable behavior of digital CMOS gates},
author = {Thomas Polzer and Andreas Steininger},
year = {2016},
doi = {10.1109/DDECS.2016.7482456},
url = {http://dx.doi.org/10.1109/DDECS.2016.7482456},
researchr = {https://researchr.org/publication/PolzerS16},
cites = {0},
citedby = {0},
pages = {56-61},
booktitle = {2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, Slovakia, April 20-22, 2016},
publisher = {IEEE},
isbn = {978-1-5090-2467-4},
}