Increasing the Fault Coverage of a Truncated Test Set - researchr publication bibtex

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Irith Pomeranz. Increasing the Fault Coverage of a Truncated Test Set. ACM Trans. Design Autom. Electr. Syst., 27(6), 2022. [doi]

@article{Pomeranz22-3,
  title = {Increasing the Fault Coverage of a Truncated Test Set},
  author = {Irith Pomeranz},
  year = {2022},
  doi = {10.1145/3508459},
  url = {https://doi.org/10.1145/3508459},
  researchr = {https://researchr.org/publication/Pomeranz22-3},
  cites = {0},
  citedby = {0},
  journal = {ACM Trans. Design Autom. Electr. Syst.},
  volume = {27},
  number = {6},
}

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