Irith Pomeranz, Sudhakar M. Reddy. Sensitivity Levels of Test Patterns and Their Usefulness in Simulation-Based Test Generation. In ICCD. pages 389-394, 2000. [doi]
@inproceedings{PomeranzR00:7,
title = {Sensitivity Levels of Test Patterns and Their Usefulness in Simulation-Based Test Generation},
author = {Irith Pomeranz and Sudhakar M. Reddy},
year = {2000},
url = {http://computer.org/proceedings/iccd/0801/08010389abs.htm},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/PomeranzR00%3A7},
cites = {0},
citedby = {0},
pages = {389-394},
booktitle = {ICCD},
}