Irith Pomeranz, Sudhakar M. Reddy. Functional Test Generation for Full Scan Circuits. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 396, IEEE Computer Society, 2000. [doi]
@inproceedings{PomeranzR00a,
title = {Functional Test Generation for Full Scan Circuits},
author = {Irith Pomeranz and Sudhakar M. Reddy},
year = {2000},
url = {http://csdl.computer.org/comp/proceedings/date/2000/0537/00/05370396abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/PomeranzR00a},
cites = {0},
citedby = {0},
pages = {396},
booktitle = {2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-0537-6},
}