Dynamic Test Compaction for Bridging Faults

Irith Pomeranz, Sudhakar M. Reddy. Dynamic Test Compaction for Bridging Faults. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 250-255, IEEE Computer Society, 2005. [doi]

Authors

Irith Pomeranz

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Sudhakar M. Reddy

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