Test vector chains for increasing the fault coverage and numbers of detections

Irith Pomeranz, Sudhakar M. Reddy. Test vector chains for increasing the fault coverage and numbers of detections. IET Computers & Digital Techniques, 3(2):222-233, 2009. [doi]

@article{PomeranzR09b-1,
  title = {Test vector chains for increasing the fault coverage and numbers of detections},
  author = {Irith Pomeranz and Sudhakar M. Reddy},
  year = {2009},
  doi = {10.1049/iet-cdt:20080056},
  url = {http://dx.doi.org/10.1049/iet-cdt:20080056},
  tags = {test coverage, testing, coverage},
  researchr = {https://researchr.org/publication/PomeranzR09b-1},
  cites = {0},
  citedby = {0},
  journal = {IET Computers & Digital Techniques},
  volume = {3},
  number = {2},
  pages = {222-233},
}