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Irith Pomeranz, Sudhakar M. Reddy. Sizes of test sets for path delay faults using strong and weak non-robust tests. IET Computers & Digital Techniques, 5(5):405-414, 2011. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On Bias in Transition Coverage of Test Sets for Path Delay FaultsIrith Pomeranz, Sudhakar M. Reddy. ats 2010: 349-352 [doi] Design-for-Testability for Improved Path Delay Fault Coverage of Critical PathsIrith Pomeranz, Sudhakar M. Reddy. vlsid 2008: 175-180 [doi]
The following publications are possibly variants of this publication: