Irith Pomeranz, Sudhakar M. Reddy. On the Number of Tests to Detect All Path Delay Faults in Combinational Logic Circuits. IEEE Transactions on Computers, 45(1):50-62, 1996.
@article{PomeranzR96a:1,
title = {On the Number of Tests to Detect All Path Delay Faults in Combinational Logic Circuits},
author = {Irith Pomeranz and Sudhakar M. Reddy},
year = {1996},
tags = {testing, logic},
researchr = {https://researchr.org/publication/PomeranzR96a%3A1},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {45},
number = {1},
pages = {50-62},
}