Surface impedance measurements in thin conducting films: Substrate and finite-thickness-induced uncertainties - researchr publication authors

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Nicola Pompeo, Kostiantyn Torokhtii, Enrico Silva. Surface impedance measurements in thin conducting films: Substrate and finite-thickness-induced uncertainties. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017. pages 1-5, IEEE, 2017. [doi]

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