Nicola Pompeo, Kostiantyn Torokhtii, Enrico Silva. Surface impedance measurements in thin conducting films: Substrate and finite-thickness-induced uncertainties. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017. pages 1-5, IEEE, 2017. [doi]
@inproceedings{PompeoTS17,
title = {Surface impedance measurements in thin conducting films: Substrate and finite-thickness-induced uncertainties},
author = {Nicola Pompeo and Kostiantyn Torokhtii and Enrico Silva},
year = {2017},
doi = {10.1109/I2MTC.2017.7969902},
url = {https://doi.org/10.1109/I2MTC.2017.7969902},
researchr = {https://researchr.org/publication/PompeoTS17},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2017, Torino, Italy, May 22-25, 2017},
publisher = {IEEE},
isbn = {978-1-5090-3596-0},
}