Wai Nam Poon, Kwabena Ebo Bennin, Jianglin Huang, Passakorn Phannachitta, Jacky Wai Keung. Cross-Project Defect Prediction Using a Credibility Theory Based Naive Bayes Classifier. In 2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017, Prague, Czech Republic, July 25-29, 2017. pages 434-441, IEEE, 2017. [doi]
@inproceedings{PoonBHPK17,
title = {Cross-Project Defect Prediction Using a Credibility Theory Based Naive Bayes Classifier},
author = {Wai Nam Poon and Kwabena Ebo Bennin and Jianglin Huang and Passakorn Phannachitta and Jacky Wai Keung},
year = {2017},
doi = {10.1109/QRS.2017.53},
url = {https://doi.org/10.1109/QRS.2017.53},
researchr = {https://researchr.org/publication/PoonBHPK17},
cites = {0},
citedby = {0},
pages = {434-441},
booktitle = {2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017, Prague, Czech Republic, July 25-29, 2017},
publisher = {IEEE},
isbn = {978-1-5386-0592-9},
}