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Cross-Project Defect Prediction Using a Credibility Theory Based Naive Bayes Classifier

Wai Nam Poon, Kwabena Ebo Bennin, Jianglin Huang, Passakorn Phannachitta, Jacky Wai Keung. Cross-Project Defect Prediction Using a Credibility Theory Based Naive Bayes Classifier. In 2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017, Prague, Czech Republic, July 25-29, 2017. pages 434-441, IEEE, 2017. [doi]

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