JITLine: A Simpler, Better, Faster, Finer-grained Just-In-Time Defect Prediction

Chanathip Pornprasit, Chakkrit Tantithamthavorn. JITLine: A Simpler, Better, Faster, Finer-grained Just-In-Time Defect Prediction. In 18th IEEE/ACM International Conference on Mining Software Repositories, MSR 2021, Madrid, Spain, May 17-19, 2021. pages 369-379, IEEE, 2021. [doi]

Abstract

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