Michele Portolan. Automated Testing Flow: The Present and the Future. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):2952-2963, 2020. [doi]
@article{Portolan20,
title = {Automated Testing Flow: The Present and the Future},
author = {Michele Portolan},
year = {2020},
doi = {10.1109/TCAD.2019.2961328},
url = {https://doi.org/10.1109/TCAD.2019.2961328},
researchr = {https://researchr.org/publication/Portolan20},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {39},
number = {10},
pages = {2952-2963},
}