Michele Portolan, Suresh Goyal, Bradford G. Van Treuren. Scalable and efficient integrated test architecture. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1, IEEE, 2009. [doi]
@inproceedings{PortolanGT09,
title = {Scalable and efficient integrated test architecture},
author = {Michele Portolan and Suresh Goyal and Bradford G. Van Treuren},
year = {2009},
doi = {10.1109/TEST.2009.5355811},
url = {http://dx.doi.org/10.1109/TEST.2009.5355811},
researchr = {https://researchr.org/publication/PortolanGT09},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009},
editor = {Gordon W. Roberts and Bill Eklow},
publisher = {IEEE},
isbn = {978-1-4244-4868-5},
}