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Finding Causally Different Tests for an Industrial Control System

Christopher M. Poskitt, Yuqi Chen 0001, Jun Sun 0001, Yu Jiang 0001. Finding Causally Different Tests for an Industrial Control System. In 45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 2578-2590, IEEE, 2023. [doi]

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Christopher M. Poskitt

This author has not been identified. It may be one of the following persons: Look up 'Christopher M. Poskitt' in Google

Yuqi Chen 0001

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Jun Sun 0001

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Yu Jiang 0001

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