Christopher M. Poskitt, Yuqi Chen 0001, Jun Sun 0001, Yu Jiang 0001. Finding Causally Different Tests for an Industrial Control System. In 45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023. pages 2578-2590, IEEE, 2023. [doi]
@inproceedings{PoskittCSJ23, title = {Finding Causally Different Tests for an Industrial Control System}, author = {Christopher M. Poskitt and Yuqi Chen 0001 and Jun Sun 0001 and Yu Jiang 0001}, year = {2023}, doi = {10.1109/ICSE48619.2023.00215}, url = {https://doi.org/10.1109/ICSE48619.2023.00215}, researchr = {https://researchr.org/publication/PoskittCSJ23}, cites = {0}, citedby = {0}, pages = {2578-2590}, booktitle = {45th IEEE/ACM International Conference on Software Engineering, ICSE 2023, Melbourne, Australia, May 14-20, 2023}, publisher = {IEEE}, isbn = {978-1-6654-5701-9}, }