H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi. Failure mechanisms and qualification testing of passive components. Microelectronics Reliability, 45(9-11):1626-1632, 2005. [doi]
Abstract is missing.