Martin Potthast, Andreas Eiselt, Alberto Barrón-Cedeño, Benno Stein, Paolo Rosso. Overview of the 3rd International Competition on Plagiarism Detection. In Vivien Petras, Pamela Forner, Paul D. Clough, editors, CLEF 2011 Labs and Workshop, Notebook Papers, 19-22 September 2011, Amsterdam, The Netherlands. 2011. [doi]
Abstract is missing.