Using a reconfigurable field programmable gate array to demonstrate boundary scan with built in self test

Hardy J. Pottinger, Chien-Yuh Lin. Using a reconfigurable field programmable gate array to demonstrate boundary scan with built in self test. In 5th Great Lakes Symposium on VLSI (GLS-VLSI 95), March 16-18, 1995, The State University of New York at Buffalo, USA. pages 242-245, IEEE Computer Society, 1995. [doi]

Abstract

Abstract is missing.