Athul Prabhu, Vlado Vorisek, Helmut Lang, Thomas Schumann. Analysis of cell-aware test pattern effectiveness - A case study using a 32-bit automotive microcontroller. In Giorgio Di Natale, editor, 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014. pages 1-2, IEEE, 2014. [doi]
Abstract is missing.