A Bayesian Network Based Approach for Root-Cause-Analysis in Manufacturing Process

Satyabrata Pradhan, Rajveer Singh, Komal Kachru, Srinivas Narasimhamurthy. A Bayesian Network Based Approach for Root-Cause-Analysis in Manufacturing Process. In Computational Intelligence and Security, International Conference, CIS 2007, Harbin, Heilongjiang, China, December 15-19, 2007. pages 10-14, IEEE Computer Society, 2007. [doi]

Abstract

Abstract is missing.