Denduang Pradubsuwun, Tomohiro Yoneda, Chris J. Myers. Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits. In Farn Wang, editor, Automated Technology for Verification and Analysis: Second International Conference, ATVA 2004, Taipei, Taiwan, ROC, October 31-November 3, 2004. Proceedings. Volume 3299 of Lecture Notes in Computer Science, pages 339-353, Springer, 2004. [doi]
@inproceedings{PradubsuwunYM04,
title = {Partial Order Reduction for Detecting Safety and Timing Failures of Timed Circuits},
author = {Denduang Pradubsuwun and Tomohiro Yoneda and Chris J. Myers},
year = {2004},
url = {http://springerlink.metapress.com/openurl.asp?genre=article&issn=0302-9743&volume=3299&spage=339},
researchr = {https://researchr.org/publication/PradubsuwunYM04},
cites = {0},
citedby = {0},
pages = {339-353},
booktitle = {Automated Technology for Verification and Analysis: Second International Conference, ATVA 2004, Taipei, Taiwan, ROC, October 31-November 3, 2004. Proceedings},
editor = {Farn Wang},
volume = {3299},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-23610-4},
}