Om Prakash, Hussam Amrouch, Sanjeev Manhas, Jörg Henkel. Impact of NBTI Aging on Self-Heating in Nanowire FET. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 1514-1519, IEEE, 2020. [doi]
@inproceedings{PrakashAMH20,
title = {Impact of NBTI Aging on Self-Heating in Nanowire FET},
author = {Om Prakash and Hussam Amrouch and Sanjeev Manhas and Jörg Henkel},
year = {2020},
doi = {10.23919/DATE48585.2020.9116267},
url = {https://doi.org/10.23919/DATE48585.2020.9116267},
researchr = {https://researchr.org/publication/PrakashAMH20},
cites = {0},
citedby = {0},
pages = {1514-1519},
booktitle = {2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020},
publisher = {IEEE},
isbn = {978-3-9819263-4-7},
}