V. Prasanth, Rubin A. Parekhji, Bharadwaj Amrutur. Safety analysis for integrated circuits in the context of hybrid systems. In IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017. pages 1-10, IEEE, 2017. [doi]
@inproceedings{PrasanthPA17, title = {Safety analysis for integrated circuits in the context of hybrid systems}, author = {V. Prasanth and Rubin A. Parekhji and Bharadwaj Amrutur}, year = {2017}, doi = {10.1109/TEST.2017.8242045}, url = {https://doi.org/10.1109/TEST.2017.8242045}, researchr = {https://researchr.org/publication/PrasanthPA17}, cites = {0}, citedby = {0}, pages = {1-10}, booktitle = {IEEE International Test Conference, ITC 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017}, publisher = {IEEE}, isbn = {978-1-5386-3413-4}, }