Integrating embedded test infrastructure in SRAM cores to detect aging

W. Prates, Leticia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian. Integrating embedded test infrastructure in SRAM cores to detect aging. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 25-30, IEEE, 2013. [doi]

Abstract

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