John Pratt, Mahir Aydin, Tom Chen. RC Extraction of Interconnects at Sub-Wavelength Dimensions. In M. H. Hamza, editor, IASTED International Conference on Artificial Intelligence and Applications, part of the 23rd Multi-Conference on Applied Informatics, Innsbruck, Austria, February 14-16, 2005. pages 491-496, IASTED/ACTA Press, 2005.
Abstract is missing.