Reliability challenges for 2.5D/3D integration: An overview

C. S. Premachandran, Seungman Choi, Salvatore Cimino, Thuy Tran-Quinn, Lloyd Burrell, Patrick Justison. Reliability challenges for 2.5D/3D integration: An overview. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 5, IEEE, 2018. [doi]

Authors

C. S. Premachandran

This author has not been identified. Look up 'C. S. Premachandran' in Google

Seungman Choi

This author has not been identified. Look up 'Seungman Choi' in Google

Salvatore Cimino

This author has not been identified. Look up 'Salvatore Cimino' in Google

Thuy Tran-Quinn

This author has not been identified. Look up 'Thuy Tran-Quinn' in Google

Lloyd Burrell

This author has not been identified. Look up 'Lloyd Burrell' in Google

Patrick Justison

This author has not been identified. Look up 'Patrick Justison' in Google